Download PDF by Sarah Fearn: An Introduction to Time-of-Flight Secondary Ion Mass

By Sarah Fearn

ISBN-10: 1681740249

ISBN-13: 9781681740249

This ebook highlights the applying of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution floor research and characterization of fabrics. whereas delivering a quick assessment of the foundations of SIMS, it additionally offers examples of the way dual-beam ToF-SIMS is used to enquire a number fabrics platforms and properties.

Over the years, SIMS instrumentation has dramatically replaced because the earliest secondary ion mass spectrometers have been first built. tools have been as soon as devoted to both the intensity profiling of fabrics utilizing high-ion-beam currents to examine close to floor to bulk areas of fabrics (dynamic SIMS), or time-of-flight tools that produced complicated mass spectra of the very outer-most floor of samples, utilizing very low-beam currents (static SIMS). Now, with the advance of dual-beam tools those very special fields now overlap.

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An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (IOP Concise Physics) by Sarah Fearn


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